Genoa Instruments is a spin-off project of the Istituto Italiano di Tecnologia pioneering new technologies in the field of optical microscopy.
The company will develop and commercialize a new confocal microscope based on the Image Scanning Microscopy technique, which will allow to achieve both spatial and temporal super-resolution at the same time.
Our innovative optical module will constitute a new paradigm in the field of optical microscopy, potentially establishing as the next generation confocal microscope.
The microscope will be highly affordable and platform independent, allowing for tailored solutions as well as for the upgrade of existing widefield and confocal microscopes.
Image scanning microscopy (ISM) improves the spatial resolution of conventional confocal laser-scanning microscopy, but current implementations reduce versatility and restrict its combination with fluorescence spectroscopy techniques, such as fluorescence lifetime.
Our team implemented a natural design of ISM based on a fast single-photon detector array, which allows straightforward upgrade of an existing confocal microscope, without compromising any of its functionalities.
In contrast to all-optical implementations, our approach provides access to the raw scanned images, also opening the way to adaptive reconstruction methods, capable of considering different imaging conditios and distortions. Castello et al., Nat. Methods (2019).
M. Castello et al., “A robust and versatile platform for image scanning microscopy enabling super-resolution FLIM,” Nat. Methods, vol. 16, no. 2, pp. 175–178, 2019.
J. Dreier et al., “Smart scanning for low-illumination and fast RESOLFT nanoscopy in vivo,” Nat. Commun., vol. 10, no. 1, p. 556, 2019. Link.
C. J. R. Sheppard, M. Castello, G. Tortarolo, G. Vicidomini, and A. Diaspro, “Image formation in image scanning microscopy, including the case of two-photon excitation,” J. Opt. Soc. Am. A, vol. 34, no. 8, pp. 1339–1350, Aug. 2017. Link.
M. Castello, C. J. R. Sheppard, A. Diaspro, and G. Vicidomini, “Image scanning microscopy with a quadrant detector,” Opt. Lett., vol. 40, no. 22, p. 5355, 2015. Link.
M. Castello, A. Diaspro, and G. Vicidomini, “Multi-images deconvolution improves signal-to-noise ratio on gated stimulated emission depletion microscopy,” Appl. Phys. Lett., vol. 105, no. 23, p. 234106, Dec. 2014. Link.
A better look at your sample with improved spatial resolution while maintaining optical-sectioning capabilities.
Take advantage of the super-brightness effect in order to collect high-resolution images with unprecedented signal-to-noise ratio.
Explore temporal dimension by performing fluorescence lifetime imaging without compromise.
A high-end tailored module
for super resolution.
Maximum compatibility with
existing scanning techniques.
Plug and Play installation
alignment diagnostic tools.
Our system can be provided as a STAND-ALONE module
or COUPLED to a regular microscope body.
Use your standard fluorescent dyes and image your sample with improved spatial resolution.